Single optical element combines soft X-ray imaging and spectroscopy
An international research team from Germany, Switzerland and Japan has demonstrated in a recent study that a single reflection zone plate (RZP) can perform both soft X-ray imaging and resonant inelastic X-ray scattering (RIXS) mapping. The approach could simplify future instruments that need to dete...
Image: Phys.org
An international research team from Germany, Switzerland and Japan has demonstrated in a recent study that a single reflection zone plate (RZP) can perform both soft X-ray imaging and resonant inelastic X-ray scattering (RIXS) mapping. The approach could simplify future instruments that need to determine both where structures are located in a material and how their electronic properties vary.
Originally published at Phys.org
