Single ion maps 3D electromagnetic fields above chips with record sensitivity
Researchers at ETH Zurich have developed a method that uses a single ion to detect electromagnetic fields above a surface and to create a three-dimensional map of them. In the future, this approach can be used to improve chips for quantum computers and quantum sensors.
Image: Phys.org
Researchers at ETH Zurich have developed a method that uses a single ion to detect electromagnetic fields above a surface and to create a three-dimensional map of them. In the future, this approach can be used to improve chips for quantum computers and quantum sensors.
Originally published at Phys.org
