'Flawless on the outside, flipped within': Detecting hidden defects in 2D dielectrics with light
A material may appear flawless on the surface yet fail to function properly. The cause lies in structural defects hidden within two-dimensional thin films, which are considered key materials for next-generation semiconductor devices. Recently, a Korean research team developed an optical analysis met...
Image: Phys.org
A material may appear flawless on the surface yet fail to function properly. The cause lies in structural defects hidden within two-dimensional thin films, which are considered key materials for next-generation semiconductor devices. Recently, a Korean research team developed an optical analysis method that can identify these invisible defects using light.
Originally published at Phys.org
