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'Flawless on the outside, flipped within': Detecting hidden defects in 2D dielectrics with light
- June 7, 2026 at 7:00 PM
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A material may appear flawless on the surface yet fail to function properly. The cause lies in structural defects hidden within two-dimensional thin films, which are considered key materials for next-generation semiconductor devices. Recently, a Korean research team developed an optical analysis method that can identify these invisible defects using light.
Originally published at Phys.org