A roadmap for atomic force microscopy use in next-generation semiconductor and energy materials research

For smartphones and computers to become smaller and faster, technologies capable of precisely controlling electrical properties at the nanoscale—beyond what is visible to the naked eye—are essential. In particular, ferroelectric materials, which can maintain their electrical state without external power, are gaining attention as key components for next-generation memory and sensor technologies. However, due to their extremely small size, there have been limitations in precisely observing the internal changes occurring within these materials.