New technique spots hidden defects to boost reliability of ultrathin electronics
Future devices will continue to probe the frontier of the very small, and at scales where functionality depends on mere atoms, even the tiniest flaw matters. Researchers at Rice University have shown that hard-to-spot defects in a widely used two-dimensional insulator can trap electrical charges and...
Image: Phys.org
Future devices will continue to probe the frontier of the very small, and at scales where functionality depends on mere atoms, even the tiniest flaw matters. Researchers at Rice University have shown that hard-to-spot defects in a widely used two-dimensional insulator can trap electrical charges and locally weaken the material, making it more likely to fail at lower voltages. The findings are published in Nano Letters.
Originally published at Phys.org
